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Technical Lecture // Do you want to avoid downtime? Integrated condition monitoring in our smart sensor technology is the answer

Company / Organizer Balluff GmbH
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Description

  • Past Event, On Demand
  • Original Date: April 30, 2021

TECHNICAL LECTURE

Do you want to avoid downtime? Integrated condition monitoring in our smart sensor technology is the answer.

Register now for third free technical lecture from our web-based technical lecture series.

In this lecture you can learn how our Smart Automation and Monitoring Systems (SAMS) can drastically reduce the number of device variants and even increase the information content of your machines at the same time. In addition, the condition monitoring information enables you to keep an eye on your "machine and plant health" at all times. The information is available to you uniformly, everywhere and immediately - whether via colored LED signal display directly on the device or on dashboards for further analysis (predictive maintenance).

Curious? The 45-minute presentation will take place at three different times in German or English.

We look forward to seeing you!

Speaker: Stephan Langer (Head of Application & Market Development)

Specific details

Location

Online